Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures-Reference-Cited by-同舟云学术

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Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures

Published:2013 Issue: Volume: Page:311-359
ISSN:
Container-title:Characterization of Semiconductor Heterostructures and Nanostructures
language:
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Author:

Renevier H.,Proietti M.G.

Publisher

Elsevier

Reference107 articles.

1. Characterization of Semiconductor Heterostructures and Nanostructures II;Boscherini,2012

2. Characterization of Semiconductor Heterostructures and Nanostructures II;Schülli,2012

3. Resonant “Forbidden” Reflections in Magnetite

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3. Low-dimensional systems investigated by x-ray absorption spectroscopy: a selection of 2D, 1D and 0D cases;Journal of Physics D: Applied Physics;2013-09-26

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