INDUSTRIAL PATTERN RECOGNITION

Author:

Suetens P.,Oosterlinck A.

Publisher

Elsevier

Reference16 articles.

1. Suetens, P. and Oosterlinck, A., Critical Review of Visual Inspection, Proc. S.P.I.E. Los Angeles, Vol. 528 - Digital Image Processing: Critical Review of Technology (Jan. 22–24, 1985).

2. Vision Guided X-Y Table for Inspection;Chen;Proc. S.P.I.E.,1982

3. Winkler, G., Automatic Visual Inspection, in: Zimmerman, N.J. and Oosterlinck, A. (eds.), Proc. Industrial Applications of Image Analysis (Antwerp, Oct. 17–19, 1983, 13–30), (D.E.B. Publishers, 1983).

4. Mundy, J.L., Image Input Systems, in: Zimmerman, N.J. and Oosterlinck, A. (eds.), Proc. Industrial Applications of Image Analysis (Antwerp, Oct. 17–19, 1983, 69–95), (D.E.B. Publishers, 1983).

5. Danielsson, P.-E., Computer Architectures for Image Analysis, in: Zimmerman, N.J. and Oosterlinck, A. (eds.), Proc. Industrial Applications of Image Analysis (Antwerp, Oct. 17–19, 1983, 119–139), (D.E.B. Publishers, 1983).

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1. Picture Processing: 1986;Computer Vision, Graphics, and Image Processing;1987-05

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