1. EEE-INST-002. Instructions for EEE parts selection, screening, qualification, and derating. NASA Goddard Space Flight Center. .
2. MIL-STD-750 Rev E. Test method standard, test methods for semiconductor devices, 20 November 2006. .
3. MIL-STD-883, Rev H. Test method standard, microcircuits. 2/26/2010. .
4. MIL-STD-202, Rev G. Test method standard, electronic and electrical component parts. 2/8/2002. .
5. MIL-PRF-19500, Rev P. Semiconductor devices, general specification. 4/6/2015. .