Electron microscope study of intrinsic and extrinsic stacking faults, and twins in SOS at the early stage of epitaxial growth
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference7 articles.
1. Physical and Electrical Investigations on Silicon Epitaxial Layers on Sapphire Substrates
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2. Production, Characterization and Application of Silicon-on-Sapphire Wafers;Key Engineering Materials;2010-06
3. Quest for an optoelectronic material: tetragonal SixGe1−x films;Thin Solid Films;2002-01
4. Texture Evolution in Si/SiC Layered Structures Deposited on Si(001) by Chemical Vapor Deposition;Journal of Materials Research;1998-09
5. Twin intersections in silicon on sapphire;Philosophical Magazine B;1991-05
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