Diffraction imaging of high quality bismuth silicon oxide with monochromatic synchrotron radiation: Implications for crystal growth-Reference-Cited by-同舟云学术

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Diffraction imaging of high quality bismuth silicon oxide with monochromatic synchrotron radiation: Implications for crystal growth

Published:1988-01 Issue:1 Volume:87 Page:79-100
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Steiner Bruce,Laor Uri,Kuriyama Masao,Long Gabrielle G.,Dobbyn Ronald C.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference27 articles.

1. NBS materials science beamlines at NSLS

2. The Czochralski growth of optical quality bismuth silicon oxide (Bi12SiO20)

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Growing high-quality Bi12SiO20 crystals of large diameter (85 mm);Technical Physics Letters;2012-05

2. Growth of Bi12GeO20 and Bi12SiO20 crystals by the low-thermal gradient Czochralski technique;Crystallography Reports;2011-03

3. Growth of Sillenite-Structure Single Crystals;Inorganic Materials;2005-01

4. X-ray diffraction topography observations of the core in Bi12SiO20 crystals doped with Mn;Materials Science and Engineering: B;2004-01

5. X-ray diffraction topography investigation of the core in Bi12SiO20 crystals;Materials Research Bulletin;2002-08

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