X-ray scattering from surfaces and interfaces and its application to the characterization of CaF2Si(111) interfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference26 articles.
1. Evaluation of the roughness of a crystal surface by X-ray scattering. I. Theoretical considerations
2. A new technique for the observation of X-ray CTR scattering by using an imaging plate detector
3. Effects of crystal surface roughness on x-ray CTR scattering
4. Absolute measurement of CTR scattering and comparison with theoretical predictions
5. Structure of the Si(111)-CaF2Interface
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1. Scanning tunneling microscopy study of CaF2 on Si(111): observation of metastable reconstructions;Journal of Physics D: Applied Physics;2021-11-23
2. Band alignment at the CaF2/Si(111) interface through advanced electronic structure calculations;Physical Review B;2020-06-01
3. Formation routes and structural details of the CaF1 layer on Si(111) from high-resolution noncontact atomic force microscopy data;Physical Review B;2018-03-15
4. Thin yttrium iron garnet films grown by pulsed laser deposition: Crystal structure, static, and dynamic magnetic properties;Journal of Applied Physics;2016-01-14
5. Large crystal local-field effects in second-harmonic generation of a Si/CaF2interface: Anab initiostudy;Physical Review B;2012-07-11
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