Silicon incorporation anomaly in LEC grown GaAs
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference10 articles.
1. The Behaviour of Some Impurities in III-V Compounds
2. Properties of Elemental and Compound Semiconductors;Whelan,1960
3. Proc. 1st Intern. Conf. on GaAs and Related Compounds;Willardson,1967
4. Current-controlled growth, segregation and amphoteric behavior of Si IN GaAs from Si-doped solutions
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1. Analysis of silicon incorporation into VGF-grown GaAs;Journal of Crystal Growth;2002-04
2. Anomalous interface shapes in the seed well during vertical gradient freeze growth of Si-doped GaAs;Journal of Crystal Growth;2001-01
3. Low dislocation density Si-doped GaAs single crystal grown by the vapor-pressure-controlled Czochralski method;Journal of Crystal Growth;1997-03
4. Impurities Interactions in the Crystal Growth of LEC Gallium Arsenide;Materials Science Forum;1996-02
5. Theoretical analysis for the segregation in the liquid encapsulated Czochralski system;Journal of Crystal Growth;1994-08
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