Angle resolved X-ray photoelectron spectroscopy of the surface of Hg0.85Zn0.15Te and after passivation processes-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Angle resolved X-ray photoelectron spectroscopy of the surface of Hg0.85Zn0.15Te and after passivation processes

Published:1994-04 Issue:1-4 Volume:138 Page:934-939
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Quemerais A.,Khelladi K.H.,Lemoine D.,Granger R.,Triboulet R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference13 articles.

1. Effect of cleanings on the composition of HgCdTe surfaces

2. (Hg,Zn)Te: A new material for IR detection

3. Thermal Expansion Coefficient and Bond Strength in Hg1−xCdxTe and Hg1−xZnxTe

4. Vacancies and surface segregation in HgCdTe and HgZnTe

5. Growth and characterization of bulk HgZnTe crystals

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Temperature dependence of the dielectric function and of the parameters of critical point transitions of CdTe;Optical Materials;1999-05

2. Electrical characterization of the p-Hg1−xZnxTe interface after anodic sulfidization treatments;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1998-07

3. Surface properties of passivated;Semiconductor Science and Technology;1998-06-01

4. The dielectric function and interband transitions in;Journal of Physics: Condensed Matter;1996-07-29

5. Optical characterization of electrochemically grown anodic oxide on Hg0.85Zn0.15Te;Semiconductor Science and Technology;1995-07-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP