Influence of Si and S doping on structural defects in LEC-grown gallium arsenide
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference32 articles.
1. Creation of defects during the growth of semiconductor single crystals and films
2. A Thermoelastic Analysis of Dislocation Generation in Pulled GaAs Crystals
3. Effect of doping on formation of dislocation structure in semiconductor crystals
4. Impurity effect on grown‐in dislocation density of InP and GaAs crystals
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1. Analysis of peculiar structural defects created in GaAs by diffusion of copper;Journal of Crystal Growth;2000-03
2. Study of silicon-doped VGF-GaAs by DSL-etching and LVM spectroscopy and the influence of B2O3 coating;Materials Science and Engineering: B;1999-12
3. Analysis of types of residual dislocations in the VGF growth of GaAs with extremely low dislocation density (EPD≪1000cm−2);Journal of Crystal Growth;1999-03
4. Analysis of Large Impurity Atmospheres at Dislocations and Associated Point Defect Reactions in Differently n-Doped GaAs Crystals;Journal de Physique III;1997-12
5. Comparative study of microdefects in dislocation-free, heavily Si doped VB GaAs by DSL etching, NIR phase contrast microscopy, TEM and X-ray diffuse scattering;Materials Science and Engineering: B;1997-02
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