Investigation of strained ZnTe epilayers by high resolution electron microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference11 articles.
1. H.P. Wagner, D. Lichtenberger, K. Wolf, S. Lankes and W. Gebhardt, J. Luminescence, to be published.
2. Investigation of strain in metalorganic vapor‐phase epitaxy grown ZnTe layers by optical methods
3. Generation of misfit dislocations in semiconductors
4. The effect of frictional stress on the calculation of critical thickness in epitaxy
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