Progress in the analysis of crystalline solids

Author:

Millett E.J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference25 articles.

1. Characterization of Semiconductor Materials;Kane,1970

2. Characterization of Solid Surfaces,1974

3. Trace Analysis Techniques for Solids;Kane,1972

4. Surface Analysis for Silicon Devices;ARPA/NBS Workshop IV,1976

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3. Analytical control of the preparation of single crystal materials by inductively coupled plasma atomic emission spectrometry;Spectrochimica Acta Part B: Atomic Spectroscopy;2002-04

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