Recent developments in the topographic assessment of crystals-Reference-Cited by-同舟云学术

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Recent developments in the topographic assessment of crystals

Published:1980-04 Issue:4 Volume:48 Page:683-686
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Authier A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference4 articles.

1. J.R. Patel and Y. Epelboin, to be published.

2. NATO Advanced Study Inst. on Characterization of Crystal Growth Defects by X-ray Methods;Chikawa,1979

3. NATO Advanced Study Inst. on Characterization of Crystal Growth Defects by X-ray Methods;Hartmann,1979

4. M. Hart, private communication.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Topographic Study of the Real Structure of Minerals;Advanced Mineralogy;1994

2. Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography);Progress in Crystal Growth and Characterization of Materials;1990-01

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