Characterisation of epitaxial CdxHg1−xTe using electrolyte electroreflectance with in-situ electrochemical etching
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference11 articles.
1. Organometallic growth of II–VI compounds
2. The growth by MOVPE and characterisation of CdxHg1−xTe
3. Electrolyte electroreflectance in the characterization of HgCdTe heterostructures
4. Interdiffusion in HgCdTe/CdTe Structures
5. Influence of the mercury vapor pressure on the isothermal growth of HgTe over CdTe
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1. Optical Properties of MCT;Mercury Cadmium Telluride;2010-09-04
2. Anodic sulfide films on HgTe and Cd0.24Hg0.76Te studied by in-situ ellipsometry;Journal of the Chemical Society, Faraday Transactions;1997
3. The behavior of the surface charge density in HgxCd1−xTe epilayers due to hydrogenation and annealing;Applied Surface Science;1996-10
4. Growth of Native Cadmium Sulfide Films on CdxHg1-xTe from Aqueous Sulfide Solutions;The Journal of Physical Chemistry;1995-10
5. Measurement of CdxHgi-xTe composition depth profiles using auger electron spectrometry on bevelled sections;Advanced Materials for Optics and Electronics;1995-03
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