Author:
Lagomarsino S.,Giannini C.,Guagliardi A.,Cedola A.,Scarinci F.,Aruta C.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. The role of surface stress in reconstruction, epitaxial growth and stabilization of mesoscopic structures
2. D. K. Bowen, B. K. Tanner, High Resolution X-ray Diffractometry and Topography and Francis, London, 1998 and reference therein
3. V. Holy, U. Pietsch, T. Baumbach, High-Resolution X-ray Scattering From Thin Films and Mulitlayers, Springer Tracts in Modern Physics No. 149 Springer, New York, 1998 and references therein.
4. Submicrometer x-ray beam production by a thin film waveguide
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Modeling of X-ray rocking curves for layers after two-stage ion-implantation;Semiconductor Physics Quantum Electronics and Optoelectronics;2017-10-09