XSW measurements of Sb on the Si(113) surface-Reference-Cited by-同舟云学术

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XSW measurements of Sb on the Si(113) surface

Published:2005-02 Issue:1-2 Volume:357 Page:115-117
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Siebert M.,Flege J.I.,Schmidt Th.,Falta J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Low-Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of Sb-induced Reconstruction on Si(113)3×2 Surface

2. Surface reconstruction suggests a nucleation mechanism in bulk: Sb/Si(113) and {113} planar defects

3. W. Kern, Semicond. Int. (1984) 94.

4. Dynamical Diffraction of X Rays by Perfect Crystals

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