Complementary neutron and X-ray reflectivity for structural characterization of porous thin films-Reference-Cited by-同舟云学术

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Complementary neutron and X-ray reflectivity for structural characterization of porous thin films

Published:2006-11 Issue: Volume:385-386 Page:667-669
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Huang Yu-Shan,Jeng U-Ser,Hsu Chia-Hung,Torikai Naoya,Lee Hsin-Yi,Shin Kwanwoo,Hino Masahiro

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Porous Silica Xerogel Processing And Integration For Ulsi Applications

2. Surface Studies of Solids by Total Reflection of X-Rays

3. Principles and applications of grazing incidence X-ray and neutron scattering from ordered molecular monolayers at the air-water interface

4. Low dielectric constant materials for microelectronics

5. Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nano-scale Morphology for Bulk Heterojunction Polymer Solar Cells;Topics in Applied Physics;2015

2. Grazing-Incidence Neutron-Induced Fluorescence Probes Density Profiles of Labeled Molecules at Solid/Liquid Interfaces;Langmuir;2013-03-14

3. Surface and interface porosity of polymer/fullerene-derivative thin films revealed by contrast variation of neutron and X-ray reflectivity;Soft Matter;2011

4. Functionalisation and Structure Characterisation of Porous Silicates and Aluminophosphates;Ordered Porous Solids;2009

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