Thermally induced defects in a polycrystalline diamond layer on a tungsten carbide substrate-Reference-Cited by-同舟云学术

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Thermally induced defects in a polycrystalline diamond layer on a tungsten carbide substrate

Published:2009-12 Issue:22 Volume:404 Page:4485-4488
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Masina B.N.,Forbes A.,Ndwandwe O.M.,Hearne G.,Mwakikunga B.W.,Katumba G.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Sintered Superhard Materials

2. Temperature Distribution in Synthetic Diamond Cutters During Orthogonal Rock Cutting

3. D.H. Zijsling, Analysis of temperature distribution and performance of polycrystalline diamond compacts bits under filed drilling conditions, in: SPE Annual Technical Conference and Exhibition, 1984, pp. 16–19.

4. Thermal degradation of sintered diamond compacts

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