An EPR investigation of SiOx films with columnar structure
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Optical and electron paramagnetic resonance study of light-emitting Si+ ion implanted silicon dioxide layers
2. Structural transformations and silicon nanocrystallite formation in SiOx films
3. Evidence of light-emitting amorphous silicon clusters confined in a silicon oxide matrix
4. Raman scattering and photoluminescence from Si nanoparticles in annealed SiOx thin films
5. Formation, evolution and photoluminescence properties of Si nanoclusters
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Dielectric resonator in rectangular ТЕ102 cavity for electron paramagnetic resonance study of thin films;Thin Solid Films;2023-03
2. Amorphous – Crystalline phase transition in nanostructural thin SiOx layers induced by pulsed laser radiation;Optics & Laser Technology;2022-04
3. Functionalization of 2D macroporous silicon under the high-pressure oxidation;Applied Surface Science;2018-03
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