A conductance model for kinetics studies when more than two phases are involved
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference42 articles.
1. A conductance model (approach) for kinetic studies: The Ti–Ta–Si system
2. Kinetic mechanisms of theC49-to-C54 polymorphic transformation in titanium disilicide thin films: A microstructure-scaled nucleation-mode transition
3. The C49 to C54 Phase Transformation in TiSi2 Thin Films
4. Self-aligned Ti and Co silicides for high performance sub-0.18 μm CMOS technologies
5. Thermal stability and electrical conduction behavior of coevaporated WSi2±xthin films
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots;Journal of Applied Physics;2008-11-15
2. Nucleation and diffusion during growth of ternary Co1−xNixSi2 thin films studied by complementary techniques in real time;Journal of Applied Physics;2008-11
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