Theoretical study on contact current density in the boundary of random rough surfaces-Reference-Cited by-同舟云学术

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Theoretical study on contact current density in the boundary of random rough surfaces

Published:2024-07 Issue: Volume:684 Page:415947
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Feshanjerdi Mohadeseh^ORCID,Masoudi Amir Ali,Tajik Fatemeh

Funder

Alzahra University

Publisher

Elsevier BV

Reference39 articles.

1. Device Electronics for Integrated Devices;Muller,2003

2. Physics of Semiconductor Devices;Sze,1981

3. Physics at Surfaces;Zangwill,1988

4. Semiconductor Physics and Applications;Balkanski,2000

5. Semiconductor Microchips and Fabrication: A Practical Guide to Theory and Manufacturing;Lian,2023

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