Investigation of the effect of annealing on the structural, morphological and optical properties of RF sputtered WO3 nanostructure
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference56 articles.
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3. Detailed analysis of the structural, morphological, optical, electrical, and dielectric properties of the reactively produced WO3 nanostructure;Journal of Materials Science: Materials in Electronics;2023-10
4. Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C;Journal of Materials Science: Materials in Electronics;2023-09
5. Structural and morphological analysis of rf sputtered nano ZnSe coatings as a function of thickness: investigation of the effect of metal contact on MIS structure with ZnSe interfacial layer;Journal of Materials Science: Materials in Electronics;2023-06
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