Structural changes in thin amorphous silicon film during electron irradiation-Reference-Cited by-同舟云学术

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Structural changes in thin amorphous silicon film during electron irradiation

Published:2020-12 Issue: Volume:598 Page:412439
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Sidorov A.I.,Zaitsev N.S.,Podsvirov O.A.

Funder

Ministry of Education and Science

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Electron beam charging of insulators: A self-consistent flight-drift model

2. Formation of silver nanoparticles in photothermorefractive glasses during electron irradiation

3. Specific features of the formation of optical waveguides in silicate glass at high energy and doze of electron irradiation

4. Formation of copper nanocrystals in photochromic glasses under electron irradiation and heat treatment

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystallization and Silicon Carbide Formation in Two-Layer Amorphous Silicon–Carbon Films during Electron Irradiation;Technical Physics;2023-12

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