Improving Fault-based Conformance Testing-Reference-Cited by-同舟云学术

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Improving Fault-based Conformance Testing

Published:2008-12 Issue:1 Volume:220 Page:63-77
ISSN:1571-0661
Container-title:Electronic Notes in Theoretical Computer Science
language:en
Short-container-title:Electronic Notes in Theoretical Computer Science

Author:

Aichernig Bernhard K.,Weiglhofer Martin,Wotawa Franz

Publisher

Elsevier BV

Subject

General Computer Science,Theoretical Computer Science

Reference22 articles.

1. Aichernig, B.K. and C.C. Delgado, From faults via test purposes to test cases: On the fault-based testing of concurrent systems., in: Proceedings of the 9th International Conference on Fundamental Approaches to Software Engineering, 2006, pp. 324–338

2. Aichernig, B.K. and J. He, Mutation testing in UTP, Formal Aspects of Computing (2008), accepted for publication

3. Aichernig, B.K., B. Peischl, M. Weiglhofer and F. Wotawa, Protocol conformance testing a SIP registrar: an industrial application of formal methods, in: Proceedings of the 5th IEEE International Conference on Software Engineering and Formal Methods (2007), pp. 215–224

4. Aichernig, B.K., B. Peischl, M. Weiglhofer and F. Wotawa, Test purpose generation in an industrial application, in: Proceedings of the 3rd International Workshop on Advances in Model-Based Testing, 2007, pp. 115–125

5. Ammann, P., P. Black and W. Majurski, Using model checking to generate tests from specifications, in: Proceedings of the Second International Conference on Formal Engineering Methods, 1998, pp. 46–54

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