Radiation testing of low cost, commercial off the shelf microcontroller board-Reference-Cited by-同舟云学术

Radiation testing of low cost, commercial off the shelf microcontroller board

Published:2021-10 Issue:10 Volume:53 Page:3335-3343
ISSN:1738-5733
Container-title:Nuclear Engineering and Technology
language:en
Short-container-title:Nuclear Engineering and Technology

Author:

Fried Tomas^ORCID,Di Buono Antonio^ORCID,Cheneler David,Cockbain Neil,Dodds Jonathan M.,Green Peter R.,Lennox Barry,Taylor C. James^ORCID,Monk Stephen D.

Funder

EPSRC

Publisher

Elsevier BV

Subject

Nuclear Energy and Engineering

Reference24 articles.

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