Optical and structural characterization of a self-aligned single electron transitor structure by cathodoluminescence microscopy-Reference-Cited by-同舟云学术

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Optical and structural characterization of a self-aligned single electron transitor structure by cathodoluminescence microscopy

Published:2000-05 Issue:3-4 Volume:7 Page:363-366
ISSN:1386-9477
Container-title:Physica E: Low-dimensional Systems and Nanostructures
language:en
Short-container-title:Physica E: Low-dimensional Systems and Nanostructures

Author:

Bertram F,Lipinski M,Riemann T,Rudloff D,Christen J,Veit P,Clos R,Eberl K

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference2 articles.

1. Transport characterization of in‐plane gate devices fabricated by direct epitaxial growth on patterned substrates

2. Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneities

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. MONTE CARLO CALCULATION FOR CATHODOLUMINESCENCE OF AlGaAs/GaAs NANOSTRUCTURE;International Journal of Nanoscience;2011-06

2. Monte Carlo model of cathodoluminescence characterization of AlAs/GaAs/AlAs laser diode;Physica E: Low-dimensional Systems and Nanostructures;2008-03

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