Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors-Reference-Cited by-同舟云学术

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Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors

Published:2002-06 Issue:2-3 Volume:5 Page:179-182
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Chu M

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of crack free BLT thick films by chemical solution deposition technique;Thin Solid Films;2015-08

2. Platinum-induced structural collapse in layered oxide polycrystalline films;Applied Physics Letters;2015-03-30

3. First-principles study of A-site substitution in ferroelectric bismuth titanate;Journal of Materials Science;2014-06-13

4. Effects of annealing ambient on ferroelectric properties and surface chemistry of sol–gel derived Bi3.25La0.75Ti3O12 thin films;Journal of Materials Science: Materials in Electronics;2013-11-17

5. Exfoliated nanoplatelets of an Aurivillius phase, Bi3.25La0.75Ti3O12: Characterisation by X-ray diffraction and by high-resolution electron microscopy;Journal of Solid State Chemistry;2008-03

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