The Development of Atom Probe Field-Ion Microscopy-Reference-Cited by-同舟云学术

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The Development of Atom Probe Field-Ion Microscopy

Published:2000-01 Issue:1-2 Volume:44 Page:11-27
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Miller M.K.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference45 articles.

1. Atom Probe Microanalysis;Miller,1989

2. Atom Probe Field Ion Microscopy;Miller,1996

3. Atom Probe Tomography;Miller,1999

4. Field ion microscope studies of single-atom diffusion and cluster nucleation on metal surfaces;Kellogg;Surface Sci. Rep.,1994

5. Atom Probe Field Ion Microscopy;Tsong,1990

Cited by 32 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB₆;The Journal of Physical Chemistry C;2024-02-08

2. Surface Dynamics of Field Evaporation in Silicon Carbide;The Journal of Physical Chemistry C;2023-03-08

3. Ab initio simulation of field evaporation;Physical Review Materials;2022-09-19

4. Controlled Impurity Admixture: From Doped Systems to Composites;Metal Oxide Nanoparticles;2021-09-12

5. Atom probe tomography;Nature Reviews Methods Primers;2021-07-22

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