Author:
Mousazadeh Saman,Cohen Israel
Subject
Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Signal Processing,Software,Control and Systems Engineering
Reference35 articles.
1. Defect detection in patterned wafers using multichannel scanning electron microscope;Zontak;Signal Process.,2009
2. Defect detection in patterned wafers using anisotropic kernels;Zontak;Mach. Vis. Appl.,2010
3. C. Spence, L. Parra, P. Sajda, Detection, synthesis and compression in mammographic image analysis with a hierarchical image probability model, in: Proceedings of the IEEE Workshop on Mathematical Methods in Biomedical Image Analysis, IEEE Computer Society, 2001.
4. Anomaly detection based on wavelet domain GARCH random field modeling;Noiboar;IEEE Trans. Geosci. Remote Sens.,2007
5. Statistical detection of defects in radiographic images in nondestructive testing;Kazantsev;Signal Process.,2002
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献