Deep learning for patent landscaping using transformer and graph embedding-Reference-Cited by-同舟云学术

Deep learning for patent landscaping using transformer and graph embedding

Published:2022-02 Issue: Volume:175 Page:121413
ISSN:0040-1625
Container-title:Technological Forecasting and Social Change
language:en
Short-container-title:Technological Forecasting and Social Change

Author:

Choi Seokkyu,Lee Hyeonju,Park Eunjeong,Choi Sungchul

Funder

National Research Foundation of Korea

Publisher

Elsevier BV

Subject

Management of Technology and Innovation,Applied Psychology,Business and International Management

Reference59 articles.

1. Automated patent landscaping;Abood;Artif. Intell. Law,2018

2. Bahdanau, D., Cho, K., Bengio, Y., 2015. Neural machine translation by jointly learning to align and translate. 3rd International Conference on Learning Representations, ICLR 2015; Conference date: 07-05-2015 Through 09-05-2015.

3. Longformer: The long-document transformer;Beltagy;arXiv:2004.05150,2020

4. Technology structural implications from the extension of a patent search method;Benson;Scientometrics,2015

5. Patent landscaping for life sciences innovation: toward consistent and transparent practices;Bubela;Nature Biotechnol.,2013

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A novel patent technology characterization method based on heterogeneous network message passing algorithm and patent classification system;Expert Systems with Applications;2024-12

2. An exploration method for technology forecasting that combines link prediction with graph embedding: A case study on blockchain;Technological Forecasting and Social Change;2024-11

3. PatentSBERTa: A deep NLP based hybrid model for patent distance and classification using augmented SBERT;Technological Forecasting and Social Change;2024-09

4. Ön eğitimli Bert modeli ile patent sınıflandırılması;Gazi Üniversitesi Mühendislik Mimarlık Fakültesi Dergisi;2024-05-20

5. Tech mining: a revisit and navigation;Frontiers in Research Metrics and Analytics;2024-04-29