Comparing the resolution of magnetic force microscopes using the CAMST reference samples-Reference-Cited by-同舟云学术

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Published:1998-12 Issue:1-2 Volume:190 Page:135-147
ISSN:0304-8853
Container-title:Journal of Magnetism and Magnetic Materials
language:en
Short-container-title:Journal of Magnetism and Magnetic Materials

Author:

Abelmann Leon,Porthun Steffen,Haast Marc,Lodder Cock,Moser Andreas,Best Margaret E,van Schendel Pieter J.A,Stiefel Bruno,Hug Hans J,Heydon Greg P,Farley Andrew,Hoon Steve R,Pfaffelhuber Thomas,Proksch Roger,Babcock Ken

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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