Anisotropy in metallic thin films patterned by the atomic saw method-Reference-Cited by-同舟云学术

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Anisotropy in metallic thin films patterned by the atomic saw method

Published:1999-08 Issue:1-3 Volume:203 Page:132-134
ISSN:0304-8853
Container-title:Journal of Magnetism and Magnetic Materials
language:en
Short-container-title:Journal of Magnetism and Magnetic Materials

Author:

Jaffrès H,Ressier L,Michelini F,Chandesris D,Le Fèvre P,Magnan H,Gauffier J.L,Mamy R,Goiran M,Peyrade J.P,Bobo J.F,Ousset J.C,Redoulès J.P,Bertrand D,Fert A.R

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. H. Jaffrès, L. Ressier, J.P. Peyrade, A.R. Fert, P. Gogol, A. Thiaville, A. Schuhl, F. Nguyen Van Dau, J. Appl. Phys., submitted for publication.

2. Uniaxial magnetic anisotropy of thin epitaxial Fe films nanostructured by the atomic saw method

3. Strong uniaxial magnetic anisotropy of nanostripes obtained by cutting thin epitaxial Fe layer using the atomic saw method

4. Structure determination of metastable epitaxial Cu layers on Ag(001) by glancing-incidence x-ray-absorption fine structure

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Polycrystalline Ni thin films on nanopatterned Si substrates: From highly conformal to nonconformal anisotropic growth;Physical Review B;2011-07-25

2. Epitaxial growth and magnetic properties of permalloy thin films on MgO (001);Journal of Magnetism and Magnetic Materials;2002-04

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