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A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering

  • Published:2000-05 Issue:1 Volume:75 Page:29-37
  • ISSN:0921-5107
  • Container-title:Materials Science and Engineering: B
  • language:en
  • Short-container-title:Materials Science and Engineering: B

Author:

Dharmadhikari C.V.,Ali A.O.,Suresh N.,Phase D.M.,Chaudhari S.M.,Gupta A.,Dasannacharya B.A.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference25 articles.

1. Nucleation and growth of thin films

2. X-ray and neutron scattering from rough surfaces

3. Surface Studies of Solids by Total Reflection of X-Rays

4. Bonnell Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications;Dawn,1993

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