Analysis of complex heterogeneous surfaces by bias-dependent scanning tunneling microscopy and spectroscopy-Reference-Cited by-同舟云学术

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Analysis of complex heterogeneous surfaces by bias-dependent scanning tunneling microscopy and spectroscopy

Published:2002-04 Issue: Volume:91-92 Page:115-119
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Goldfarb I.,Briggs G.A.D.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference33 articles.

1. Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling Microscopy

2. Voltage‐dependent scanning tunneling microscopy imaging of semiconductor surfaces

3. Anomalous Corrugations in Scanning Tunneling Microscopy: Imaging of Individual States

4. STM experiment and atomistic modelling hand in hand: individual molecules on semiconductor surfaces

5. Electronic properties of tetrahedral amorphous carbon investigated by scanning tunneling microscopy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reconstruction models of cubic SiC surfaces;Journal of Physics: Condensed Matter;2004-04-17

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