Author:
Bocchi C.,Germini F.,Mukhamedzhanov E.Kh.,Nasi L.,Privitera V.,Spinella C.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
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4. Ion beams in silicon processing and characterization
5. Investigation of lattice distortions in InP crystals implanted with Fe+ions by means of high‐resolution x‐ray diffraction and x‐ray standing‐wave methods
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