Author:
Šatka A.,Donoval D.,Mika F.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference16 articles.
1. L. Reimer, Berlin, Heidelberg, Springer-Verlag, 1985, pp. 457, ISBN 3-540-13530-8.
2. L.J. Bulk, E. Kubalek, E. Menzel, Scanning Electron Microscopy, Part I (1975) 447.
3. Electro-optic properties of InGaAs/InP multi-quantum well PIN structures
4. Time resolved OBIC/EBIC mapping of InGaAsP/InP photodiodes
5. Measurement of minority carrier lifetime in GaAs and GaAs1−xPx with an intensity-modulated electron beam
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献