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Constrained locating arrays for combinatorial interaction testing

  • Published:2020-12 Issue: Volume:170 Page:110771
  • ISSN:0164-1212
  • Container-title:Journal of Systems and Software
  • language:en
  • Short-container-title:Journal of Systems and Software

Author:

Jin Hao,Tsuchiya Tatsuhiro

Publisher

Elsevier BV

Subject

Hardware and Architecture,Information Systems,Software

Reference54 articles.

1. Constrained interaction testing: A systematic literature study;Ahmed;IEEE Access,2017

2. Efficient and guaranteed detection of t-way failure-inducing combinations;Arcaini,2019

3. Generating combinatorial test cases by efficient sat encodings suitable for cdcl sat solvers;Banbara,2010

4. Practical fault localization with combinatorial test design;Blue,2019

5. A framework for automated combinatorial test generation, execution, and fault characterization;Bonn,2019

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1. Detecting arrays for effects of multiple interacting factors;Information and Computation;2024-12

2. Efficient Greedy Algorithms with Accuracy Guarantees for Combinatorial Restrictions;SN Computer Science;2024-02-01

3. Constrained detecting arrays: Mathematical structures for fault identification in combinatorial interaction testing;Information and Software Technology;2023-01

4. Error-Correcting Locating Arrays for Interaction Fault Location in Combinatorial Testing;2022 IEEE International Symposium on Information Theory (ISIT);2022-06-26

5. Fault Localization and Test Oracle Generation Based on the Mutual Pattern of Discrete Path Variables;2021 IEEE 21st International Conference on Software Quality, Reliability and Security Companion (QRS-C);2021-12
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