Commit-time defect prediction using one-class classification-Reference-Cited by-同舟云学术

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Commit-time defect prediction using one-class classification

Published:2024-02 Issue: Volume:208 Page:111914
ISSN:0164-1212
Container-title:Journal of Systems and Software
language:en
Short-container-title:Journal of Systems and Software

Author:

Shehab Mohammed A.,Khreich Wael,Hamou-Lhadj Abdelwahab^ORCID,Sedki Issam

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Elsevier BV

Subject

Hardware and Architecture,Information Systems,Software

Reference62 articles.

1. Modern Information Retrieval;Baeza-Yates,1999

2. One-class versus binary classification: Which and when?;Bellinger,2012

3. Pattern Recognition and Machine Learning;Bishop,2006

4. Practical Statistics for Data Scientists: 50 Essential Concepts;Bruce,2017

5. Feature engineering and selection: A practical approach for predictive models;Butcher;Amer. Statist.,2020

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