Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company-Reference-Cited by-同舟云学术

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Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company

Published:2018-03 Issue: Volume:137 Page:355-365
ISSN:0164-1212
Container-title:Journal of Systems and Software
language:en
Short-container-title:Journal of Systems and Software

Author:

Abuta Eric,Tian Jeff

Publisher

Elsevier BV

Subject

Hardware and Architecture,Information Systems,Software

Reference18 articles.

1. Defect analysis over multiple release versions of a semiconductor software system;Abuta,2015

2. Time-dependent error-detection rate model for software reliabiltiy and other performance measures;Goel;IEEE Trans. Reliab.,1979

3. Log-logistic software reliability growth model;Gokhale,1998

4. IEEE Recommended Practice on Software Reliability;IEEE,2008

5. Systems and Software Engineering – Vocabulary;ISO/IEC/IEEE,2010

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