An approach to testing commercial embedded systems-Reference-Cited by-同舟云学术

An approach to testing commercial embedded systems

Author:

Yu Tingting,Sung Ahyoung,Srisa-an Witawas,Rothermel Gregg

Funder

AFOSR

Korea Research Foundation

Publisher

Elsevier BV

Subject

Hardware and Architecture,Information Systems,Software

Reference103 articles.

1. Run-time detection of potential deadlocks for programs with locks, semaphores, and condition variables;Agarwal,2006

2. Temporal white-box testing using evolutionary algorithms;Al Moubayed,2009

3. Altera Corporation. Altera Nios-II Embedded Processors. http://www.altera.com/products/devices/nios/nioindex.html.

4. General test result checking with log file analysis;Andrews;IEEE Transactions on Software Engineering,2003

5. Foundations of Multithreaded, Parallel, and Distributed Programming;Andrews,2000

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Test Automation and Its Limitations: A Case Study;2019 34th IEEE/ACM International Conference on Automated Software Engineering (ASE);2019-11

3. A Comprehensive Study on Knowledge Management Applied to Embedded System Testing Processes;2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC);2019-08