A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation-Reference-Cited by-同舟云学术

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A simple method for residual stress measurements in thin films by means of focused ion beam milling and digital image correlation

Published:2013-01 Issue: Volume:215 Page:247-252
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Krottenthaler M.,Schmid C.,Schaufler J.,Durst K.,Göken M.

Funder

German Research Foundation (DFG)

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

1. Diamond-like carbon: state of the art

2. A method for in situ measurement of the residual stress in thin films by using the focused ion beam

3. Residual Stress Measurement on a MEMS Structure With High-Spatial Resolution

4. Digital image correlation of nanoscale deformation fields for local stress measurement in thin films

5. Mapping Residual Stress Profiles at the Micron Scale Using FIB Micro-Hole Drilling

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1. Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling;Journal of Manufacturing and Materials Processing;2024-07-04

2. FIB-DIC ring-core measurement of the residual stress on HiPIMS W/Cu and Cr/Cu multilayer thin films;Surface and Coatings Technology;2024-05

3. Research progress of residual stress measurement methods;Heliyon;2024-04

4. Focused ion beam technique for micro/nanoscale fabrication: Progress over the last decade;Comprehensive Materials Processing;2024

5. Improved adhesion of cathodic arc PVD AlCrSiN coating on ion-implanted WC-Co substrates;International Journal of Refractory Metals and Hard Materials;2023-06

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