Electrical and optical properties dependence on evolution of roughness and thickness of Ga:ZnO films on rough quartz substrates-Reference-Cited by-同舟云学术

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Electrical and optical properties dependence on evolution of roughness and thickness of Ga:ZnO films on rough quartz substrates

Published:2011-02 Issue:11 Volume:205 Page:3530-3534
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Liu Yun-yan,Yang Shan-ying,Wei Gong-xiang,Song Hong-sheng,Cheng Chuan-fu,Xue Chen-shan,Yuan Yu-zhen

Funder

National Science Foundation of China

Shandong Provincial Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference22 articles.

1. Highly textured ZnO thin films doped with indium prepared by the pyrosol method

2. Technology and Applications of Amorphous Silicon;Street,2000

3. Zinc oxide thin film doped with Al2O3, TiO2 and V2O5 as sensitive sensor for trimethylamine gas

4. Effects of sputtering power on the properties of ZnO:Ga films deposited by r.f. magnetron-sputtering at low temperature

5. The effect of processing parameters on the properties of Ga-doped ZnO thin films by RF magnetron sputtering

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4. Influence of sodium dodecyl sulfate as a surfactant on the microstructural, morphological and optoelectronic characteristics of SILAR deposited CuO thin films;Materials Research Express;2019-05-03

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