Restrictions of stress measurements using the curvature method by thermally induced plastic deformation of silicon substrates-Reference-Cited by-同舟云学术

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Restrictions of stress measurements using the curvature method by thermally induced plastic deformation of silicon substrates

Published:2015-07 Issue: Volume:274 Page:68-75
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Saringer Christian^ORCID,Tkadletz Michael,Mitterer Christian

Funder

Bundesministerium für Verkehr, Innovation und Technologie

Bundesministerium für Wissenschaft, Forschung und Wirtschaft

Österreichische Forschungsförderungsgesellschaft

Steirische Wirtschaftsförderungsgesellschaft

Standortagentur Tirol

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference42 articles.

1. Comprehensive Hard Materials;Schleinkofer,2014

2. Residual stresses in PVD hard coatings

3. The origin of stresses in magnetron-sputtered thin films with zone T structures

4. Effect of residual stresses on the strength, adhesion and wear resistance of SiC coatings obtained by plasma-enhanced chemical vapor deposition on low alloy steel

5. Influence of the Coating Residual Stresses on the Tool Wear

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