An XPS and ellipsometry study of Cr–O–Al mixed oxides grown by reactive magnetron sputtering-Reference-Cited by-同舟云学术

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An XPS and ellipsometry study of Cr–O–Al mixed oxides grown by reactive magnetron sputtering

Published:2011-12 Issue:6 Volume:206 Page:1484-1489
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Benito N.,Díaz D.,Vergara L.,Galindo R. Escobar,Sánchez O.,Palacio C.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference24 articles.

1. Preparation and photocatalytic activity of ZnO/TiO2/SnO2 mixture

2. Nanostructured Ti–M mixed-metal oxides: Toward a visible light-driven photocatalyst

3. Applications of thin films in microelectronics

4. Effect of dimethylamine borane concentration on antireflection properties of silica thin films via redox deposition

5. The deposition and optical properties of Ge1−xCx thin film and infrared multilayer antireflection coatings

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