Structural analysis of hydrogenated nano-crystalline silicon suboxide (nc-SiOx:H, x < 1) thin films with SAXS for a potential application as phase change material-Reference-Cited by-同舟云学术

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Structural analysis of hydrogenated nano-crystalline silicon suboxide (nc-SiOx:H, x < 1) thin films with SAXS for a potential application as phase change material

Published:2019-09 Issue: Volume:374 Page:164-170
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Bam Begüm Çınar,Rüzgar Kemal^ORCID,Bacıoğlu Akın^ORCID,İde Semra

Funder

Hacettepe University

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference48 articles.

1. Controlling the opto-electronic properties of nc-SiOx:H films by promotion of 〈220〉 orientation in the growth of ultra-nanocrystallites at the grain boundary;Das;Appl. Surf. Sci.,2018

2. Influence of average size and interface passivation on the spectral emission of Si nanocrystals embedded in SiO2;Fernandez;J. Appl. Phys.,2002

3. Photoluminescent properties of nc-Si/SiOxnanosystems;Olenych;Appl. Nanosci.,2018

4. Optical properties of high photoluminescence silicon nanocrystals embedded in SiO2 matrices obtained by annealing hydrogen silsesquioxane;Zhou;Opt. Mater.,2018

5. Thin-film silicon-based quadruple junction solar cells approaching 20% conversion efficiency;Isabella;Sol. Energy Mater. Sol. Cells,2014

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