Focused ion beam optical patterning of ta-C films-Reference-Cited by-同舟云学术

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Focused ion beam optical patterning of ta-C films

Published:2016-11 Issue: Volume:306 Page:341-345
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Tsvetkova T.,Berova M.,Sandulov M.,Kitova S.,Avramov L.,Boettger R.,Bischoff L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference20 articles.

1. Properties of filtered-ion-beam-deposited diamondlike carbon as a function of ion energy

2. The structure of tetrahedral amorphous carbon thin films

3. Nitrogen doping of highly tetrahedral amorphous carbon

4. The contribution of ion-beam techniques to the physics and technology of amorphous semiconductors

5. Novel concepts for mass storage of archival data

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion Beams for Nanoscale Optical Data Storage;Ion Beam Applications;2018-07-18

2. Surface characterisation of Ga+ion implanted ta-C thin films;Journal of Physics: Conference Series;2017-01

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