Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction-Reference-Cited by-同舟云学术

Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction

Published:2004-04 Issue:1 Volume:182 Page:43-54
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Baczmanski A,Braham C,Seiler W,Shiraki N

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference32 articles.

1. Shot Peening;Wohlfahrt,1987

2. E.S. Rowland, in: J.J. Burke et.al, (Eds.) Proceedings of 10th Sagamore Army Materials Research Conferene, Sagamore Conference Center, New York, 1963, pp. 229–244

3. Residual stress measurement in thermal sprayed hydroxyapatite coatings

4. Practical measurement of the residual stress in coatings

5. M.D.B. Wilks, D. Nowell, D.A. Hills, in: Proceedings of 4th International Conference on Residual Stresses, Baltimore Maryland, Society for Experimental Mechanics, 1994, pp. 1238–1245

Cited by 60 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Finite element modeling of thermal residual stresses in functionally graded aluminum-matrix composites using X-ray micro-computed tomography;Finite Elements in Analysis and Design;2024-11

2. Residual stresses prediction in transition metal nitrides sputtered coatings using artificial neural network and experimental evaluation of surface morphology;Journal of Materials Research and Technology;2024-09

3. Deposition and nanoindentation study of a novel TiNi/Ag bi-layer shape memory film;Journal of Materials Research and Technology;2024-05

4. Finite Element Modeling of Thermal Residual Stresses in Functionally Graded Aluminum-Matrix Composites Using X-Ray Micro-Computed Tomography;2024

5. Surface stress release in AlCrN coatings determined by synchrotron radiation multi-reflection grazing-incidence X-ray diffraction;Thin Solid Films;2023-12