Quantitative analyses of rare-earth elements in minerals by secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Quantitative analyses of rare-earth elements in minerals by secondary ion mass spectrometry

Published:1987-10 Issue:3-4 Volume:64 Page:269-278
ISSN:0009-2541
Container-title:Chemical Geology
language:en
Short-container-title:Chemical Geology

Author:

Muir I.J.,Bancroft G.M.,MacRae N.D.,Metson J.B.

Publisher

Elsevier BV

Subject

Geochemistry and Petrology,Geology

Reference32 articles.

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4. X-ray fluorescence of geological samples using 32–84 keV synchrotron radiation, I. Analytical technique;Hanson;EOS (Trans. Am. Geophys. Union),1985

5. Relative and absolute terrestrial abundances of the rare earths;Haskin,1986

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