Density and composition analysis using focused MeV ion mubeam techniques-Reference-Cited by-同舟云学术

Density and composition analysis using focused MeV ion mubeam techniques

Published:1994-12 Issue:1-3 Volume:353 Page:568-574
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Antolak A.J.,Bench G.S.,Pontau A.E.,Morse D.H.,Heikkinen D.W.,Weirup D.L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. Ion microbeam tomography

2. PIXE-STIM microtomography: Zinc and manganese concentrations in a scorpion stinger

3. PIXE tomography of samples with inhomogeneous elemental composition

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