Development of test structures for silicon particle detectors-Reference-Cited by-同舟云学术

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Development of test structures for silicon particle detectors

Published:1987-01 Issue:3 Volume:253 Page:325-332
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Heijne E.H.M.,Debusschere I.,Declerck G.,Vanstraelen G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference7 articles.

1. Fabrication of low noise silicon radiation detectors by the planar process

2. Proc. 2nd European Symp. on Electro-Optical Engineering;Heijne,1985

3. A deep-depletion CCD imager for soft X-ray, visible, and near-infrared sensing

4. Semiconductor Power Devices;Ghandi,1977

5. Deep Depletion CCDs with Increased UV Sensitivity;Bosiers,1985

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomistic modeling to the investigation of irradiation effect on optical properties of LiI/ZnS scintillator in a research reactor-based neutron radiography facility;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-05

2. Measurements of degradation of silicon detectors and electronics in various radiation environments;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1990-03

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