Fine tuning of track impact parameter resolution of the DELPHI detector-Reference-Cited by-同舟云学术

Fine tuning of track impact parameter resolution of the DELPHI detector

Published:1996-03 Issue:1-2 Volume:372 Page:181-187
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Borisov G.,Mariotti C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. The DELPHI Microvertex detector

2. The DELPHI silicon strip microvertex detector with double sided readout

3. Measurement of $$\frac{{\Gamma _{b\bar b} }}{{\Gamma _{had} }}$$ using impact parameter measurements and lepton identification

4. Measurement of the forward-backward asymmetry ofe + e −→Z→ $$b\bar b$$ using prompt leptons and a lifetime tag

5. Lifetimes of Charged and Neutral B Hadrons using Event Topology,1995

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